Stack capacitor of memory device and fabrication method thereof

ABSTRACT

The invention provides a method for forming a stack capacitor of a memory device, including providing a substrate, forming a patterned sacrificial layer with a plurality of first openings over the substrate, conformally forming a first conductive layer on the patterned sacrificial layer and in the first openings, forming a second conductive layer on the first conductive layer to seal the first openings with a void formed therein, removing a portion of the first and second conductive layers to expose the patterned sacrificial layer, and removing at least a portion of the patterned sacrificial layer to form bottom cell plates.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates generally to a method for forming a semiconductor device and more particularly relates to a method for forming capacitors of a memory device.

2. Description of the Related Art

As DRAMs increase in memory cell density, there is a continuing challenge to maintain sufficiently high storage capacitance despite decreasing cell area. Additionally, there is a continuing goal to further decrease cell area. The principal way for increasing cell capacitance is through cell structure techniques. Such techniques include three-dimensional cell capacitors, such as trenched or stacked capacitors. Moreover, the container structure can be classified as cylinder type or pedestal type structure. This invention concerns stacked capacitor cell constructions, including, what are commonly known as pedestal container stacked capacitors.

BRIEF SUMMARY OF INVENTION

The invention provides a method for forming a stack capacitor of a memory device, comprising providing a substrate, forming a patterned sacrificial layer with a plurality of first openings over the substrate, conformally forming a first conductive layer on the patterned sacrificial layer and in the first openings, forming a second conductive layer on the first conductive layer to seal the first openings with a void formed therein, removing a portion of the first and second conductive layers to expose the patterned sacrificial layer, and removing at least a portion of the patterned sacrificial layer to form bottom cell plates.

The invention further provides a stack capacitor of a memory device, comprising a bottom cell plate including a void therein, wherein a top portion and a side portion of the bottom cell plate are formed of different depositions method such that the top portion and the side portion of the bottom cell plate have different orientations, a capacitor dielectric layer on the bottom cell plate, and a top cell plate on the capacitor dielectric layer.

BRIEF DESCRIPTION OF DRAWINGS

The invention can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein,

FIG. 1A to FIG. 1D show a method for forming bottom cell plates of capacitors of a memory device.

FIG. 2A˜FIG. 2G show a method for forming stacked capacitors of a memory device of an embodiment of the invention.

FIG. 3A˜FIG. 3J show a method for forming stacked capacitors of a memory device of another embodiment of the invention.

FIG. 4 shows a plan view at the stage when the spacer layer is etched of a memory device of an embodiment of the invention.

FIG. 3G shows a cross section along line A-A′ of FIG. 4.

FIG. 3H shows a cross section along line B-B′ of FIG. 4.

FIG. 5 show a plan view at the stage when the lower sacrificial layer is etched of a memory device of an embodiment of the invention.

FIG. 3I shows a cross section along line A-A′ of FIG. 5.

FIG. 3J shows a cross section along line B-B′ of FIG. 5.

DETAILED DESCRIPTION OF INVENTION

FIG. 1A to FIG. 1D show cross sections for forming bottom cell plates of capacitors of a memory device. Following a description of the FIGS, problems found in the fabrication method will be highlighted. Referring to FIG. 1A, a substrate 102 is provided. An oxide layer 104 and a nitride layer 106 are formed on the substrate 102. A patterned sacrificial oxide layer 108 with a plurality of openings 109 are formed on the nitride layer 106. Referring to FIG. 1B, a TiN layer 110 is formed on the patterned sacrificial oxide layer 108 and filled into the openings 109 by atomic layer deposition. Note that the deposited TiN layer 110 is required to have a thickness greater than 1/2 F (feature) for forming bottom cell plates. Referring to FIG. 1C, a metal chemical mechanical polishing (CMP) process is performed to remove a portion of the TiN layer 110 exceeding the patterned sacrificial oxide layer 108, such that the patterned sacrificial oxide layer 108 and the TiN layer 110 may form a planar surface. Referring to FIG. 1D, the patterned sacrificial oxide layer 108 is removed by an etching back process to form a plurality of cylindrical bottom cell plates 112. As described, the TiN layer 110 is required to be thick. However, a thick TiN layer 110 causes wafer bow issues, increases costs, and lowers throughput.

Accordingly, a novel method for forming stacked capacitors of a memory device will be described in accordance with FIG. 2A˜FIG. 2G. First, referring to FIG. 2A, a substrate 202 is provided. In the embodiment, the substrate 202 can be a semiconductor substrate, for example comprising bulk silicon, polysilicon or silicon on insulator (SOI). Preferably, the substrate is a silicon substrate. A first dielectric layer 204, preferably a silicon oxide layer, is formed on the substrate 202. A second dielectric layer 206, preferably a silicon nitride layer, is formed on the first dielectric layer 204. A sacrificial layer 208, preferably a silicon oxide layer, is formed on the second dielectric layer 206. The first dielectric layer 204, the second dielectric layer 206 and the sacrificial layer 208 may be formed by chemical vapor deposition. Referring to FIG. 2B, the sacrificial layer 208 is patterned by lithography and etching to form a plurality of openings 210. Note that the sacrificial layer 208 preferably has high etching selectivity with the second dielectric layer 206 such that the etching process for forming the openings 210 is stopped at the second dielectric layer 206. The following paragraph describes formation of a container. Referring to FIG. 2C, a first conductive layer 212 is conformally formed on the sacrificial layer 208 and in the openings 210. The first conductive layer 212 preferably comprising TiN, Ru and W, is thin, such as 8˜10 nm thickness, and may be formed by atomic layer deposition. Following, as an important feature of the embodiment, as shown in FIG. 2D, a second conductive layer 214 is deposited on the first conductive layer 212 to seal the openings 210. The second conductive layer 214 is preferably formed by a deposition method. In this manner, the deposited film may gather at the top portion and the bottom portion of the openings 210 of the sacrificial layer to seal the openings 210. In the embodiment, the second conductive layer 214 is preferably formed by physical vapor deposition. Also, preferably, pressure is in the range of 0.1 to 10 mTorr, temperature is in the range of 25 to 250 degree C. and power is in the range of 200 to 6000 W. As shown in FIG. 2D, since the openings 210 are sealed by the second conductive layer 214, a void 215 is formed corresponding to each opening 210. Also, since the first conductive layer 212 and the second conductive layer 214 are deposited by different deposition methods, the two films have different orientations. Referring to FIG. 2E, a CMP process is performed to remove a portion of the first conductive layer 212 and the second conductive layer 214 exceeding the sacrificial layer 208. Thus, the top surface of the sacrificial layer 208 is exposed. Thereafter, referring to FIG. 2F, the sacrificial layer 208 is removed to form the bottom cell plates 216. Because the sacrificial layer 208 comprises silicon oxide, the sacrificial layer 208 can be removed by dipping in a solution containing HF. Referring to FIG. 2G, a capacitor dielectric layer 218 is formed on the bottom cell plate. The capacitor dielectric layer may comprise silicon oxide, silicon nitride, silicon oxynitride, or high-K (for example, K>8) dielectric materials. Preferably, the capacitor dielectric layer comprises high-K dielectric material. The high-K dielectric material may comprise metal oxides, metal silicates, metal nitrides, transition metal-oxides, transition metal silicates, metal aluminates, and transition metal nitrides, or combinations thereof. For example, the high-K dielectric material may comprise, but is not limited to, one or more of aluminum oxide (Al₂O₃), hafnium oxide (HfO₂), hafnium oxynitride (HfON), hafnium silicate (HfSiO₄), zirconium oxide (ZrO₂), zirconium oxynitride (ZrON), zirconium silicate (ZrSiO₂), yttrium oxide (Y₂O₃), lanthanum oxide (La₂O₃), cerium oxide (CeO₂), titanium oxide (TiO₂), tantalum oxide (Ta₂O₅), or combinations thereof. Next, a third conductive layer 220, preferably comprising TiN, Ru or W, is formed on the capacitor dielectric layer 218 to form a top cell plate. Therefore, completing formation of a stacked capacitor cell of a memory device. Because the embodiment uses two deposition steps to form two conductive films when forming the bottom cell plates, a thick conductive layer for forming bottom cell plates is not required to be deposited. Accordingly, wafer bow problems are eliminated and stress related to issues, such as overlay or alignment failure issues, can be reduced. Moreover, the embodiment can have a higher throughput and lower cost.

Another method for forming stacked capacitors of a memory device is described in accordance with FIG. 3A˜FIG. 3J. First, referring to FIG. 3A, a substrate 302 is provided. In the embodiment, the substrate 302 can be a semiconductor and is preferably comprised of silicon. A first dielectric layer 304, preferably a silicon oxide layer, is formed on the substrate 302. A second dielectric layer 306, preferably a silicon nitride layer, is formed on the first dielectric layer 304. A lower sacrificial layer 308, such as a polysilicon layer or an oxide layer, is formed on the second dielectric layer 306. A upper sacrificial layer 310, preferably comprising doped oxide, is formed on the lower sacrificial layer 308. In the embodiment, the combination of the lower sacrificial layer 308 and the upper sacrificial layer 310 can be referred to as a sacrificial layer 311. Referring to FIG. 3B, the lower sacrificial layer 308 and the upper sacrificial layer 310 is patterned by lithography and etching to form a plurality of openings 312. Referring to FIG. 3C, a first conductive layer 314 is conformally formed on the sacrificial layer 311 and in the openings 312. The first conductive layer 314 preferably comprises TiN, W or Ru and is thin, such as 8˜10 nm thickness. In addition, the first conductive layer 314 can be formed by atomic layer deposition. Referring to FIG. 3D, a second conductive layer 316 is deposited on the first conductive layer 314. The second conductive layer 316 is preferably formed by a deposition method, wherein the deposited film gathers at the top portion of the openings 312 to seal the openings 312. As shown in FIG. 3D, since the openings are sealed by the second conductive layer 316, a void 317 is formed corresponding to each opening. Also, since the first conductive layer 314 and the second conductive layer 316 are deposited by different deposition methods, the two films have different orientations. Referring to FIG. 3E, a CMP process is performed to remove a portion of the first conductive layer 314 and the second conductive layer 316 exceeding the upper sacrificial layer 310, such that the top surface of the upper sacrificial layer 310 is exposed. Thereafter, the upper sacrificial layer 310 is removed to expose the lower sacrificial layer 308 thereunder and form a plurality of openings 320 between the cylindrical containers 318 and over the lower sacrificial layer 308. Because the upper sacrificial layer 310 comprises silicon oxide, the upper sacrificial layer 310 can be removed by dipping in a solution containing HF. Referring to FIG. 3F, a spacer layer 322, preferably a silicon nitride layer, is formed on the cylindrical containers 318 and filled into the openings 320. Referring to FIG. 3G, FIG. 3H and FIG. 4, wherein FIG. 4 shows a plan view of an etched spacer layer, FIG. 3G shows a cross section along line A-A′ of FIG. 4, and FIG. 3H shows a cross section along line B-B′ of FIG. 4, the spacer layer 322 is etched to form lattices 324 connecting top portions of adjacent four cylindrical containers 318. Note that a portion of the spacer layer 322 in the center area of the four cylindrical containers 318 can be etched away to form an opening 326, while a portion of the spacer between the adjacent cylindrical containers 318 may be left to form the lattices 324. Referring to FIG. 3I, FIG. 3J and FIG. 5, wherein FIG. 5 shows a plan view of an etched lower sacrificial layer, FIG. 3I shows a cross section along line A-A′ of FIG. 5, and FIG. 3J shows a cross section along line B-B′ of FIG. 5, the lower sacrificial layer 308 is removed by etching through the opening 326 in the previously formed spacer layer 322 to form bottom cell plates connected by lattices Like the embodiment illustrated in FIG. 2A˜2G, two conductive films are also used to form a bottom cell plate of this embodiment. Thus, a thick conductive layer for forming bottom cell plates is not required to be deposited. Accordingly, wafer bow problems are eliminated and stress related to issues, such as overlay or alignment failure issues, can be reduced. Moreover, the embodiment can have a higher throughput and lower cost.

While the invention has been described by way of example and in terms of the preferred embodiments, it is to be understood that the invention is not limited to the disclosed embodiments. It is intended to cover various modifications and similar arrangements (as would be apparent to those skilled in the art). Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements. 

1-15. (canceled)
 16. A stack capacitor of a memory device, comprising: a bottom cell plate including a void therein, wherein a top portion and a side portion of the bottom cell plate are formed by different deposition methods such that the top portion and the side portion of the bottom cell plate have different orientations; a capacitor dielectric layer on the bottom cell plate; and a top cell plate on the capacitor dielectric layer.
 17. The stack capacitor of a memory device as claimed in claim 16, wherein the bottom cell plate comprises TiN, Ru or W.
 18. The stack capacitor of a memory device as claimed in claim 16, wherein the top cell plate comprises TiN, Ru or W.
 19. The stack capacitor of a memory device as claimed in claim 16, wherein the capacitor dielectric layer is a high k dielectric layer.
 20. The stack capacitor of a memory device as claimed in claim 19, wherein the high k dielectric layer comprises aluminum oxide (Al₂O₃), hafnium oxide (HfO₂), hafnium oxynitride (HfON), hafnium silicate (HfSiO₄), zirconium oxide (ZrO₂), zirconium oxynitride (ZrON), zirconium silicate (ZrSiO₂), yttrium oxide (Y₂O₃), lanthanum oxide (La₂O₃), cerium oxide (CeO₂), titanium oxide (TiO₂), tantalum oxide (Ta₂O₅), or combinations thereof. 